Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...

An interview with Prof. David Alsteens, Université Catholique de Louvain conducted by April Cashin-Garbutt, MA (Cantab). Can you please give a brief introduction to your research using AFM to image ...

insights from industryDr. Thomas MuellerDirector of Product ManagementBruker Nano Surfaces An interview with Dr. Thomas Mueller, Director of Product Management at Bruker Nano Surfaces conducted by ...

Bruker’s PeakForce Tapping is an exclusive operating mode in atomic force microscope (AFM) technology following the launch of TappingMode. This mode provides high resolution imaging, measuring samples ...

SAN JOSE, Calif. &#151 Chip-equipment provider Veeco Instruments Inc. (Woodbury, N.Y.) has signed a joint development program in the atomic force microscopy (AFM) market with France's CEA Leti and ...

STANFORD, Calif., Nov. 27, 2025 /PRNewswire/ -- nano@stanford at Stanford University will host a two-day scientific program on December 2–3, 2025 to commemorate the 40th anniversary of Atomic Force ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

SANTA CLARA, Calif., April 21, 2021 /PRNewswire/ -- Park Systems, world leading manufacturer of Atomic Force Microscopes announced the company stock valuation exceeded 1 Trillion KRW (almost $1 ...